Computational Imaging and Measurement: A New Journal Led by Imaging Field Innovator Prof. Chao Zuo Officially Launched
Science Exploration Press proudly announces the launch of Computational Imaging and Measurement (CIM), a peer-reviewed and open-access journal committed to advancing the frontiers of computational imaging and optical measurement. We are honored to welcome Professor Chao Zuo as the Founding Editor-in-Chief of CIM.
Professor Chao Zuo
Professor Chao Zuo is Zijin Chair Professor at Nanjing University of Science and Technology (NJUST) and Distinguished Professor of the “Changjiang Scholars Program” by the Ministry of Education of China. He is the founder and director of the Smart Computational Imaging Laboratory (SCILab) and the Smart Computational Imaging Research Institute at NJUST. A world-renowned leader in computational phase imaging and optical metrology, Professor Zuo’s work integrates optical modulation with advanced information processing to drive novel imaging systems and measurement instruments.
Professor Zuo’s research, with over 20,000 citations, has been featured multiple times on the covers of leading journals such as eLight, Light: Science & Applications, Optica, Advanced Photonics, and LPR, and has been widely reported by top science media including Nature Publishing Group, MIT Technology Review, and SPIE Newsroom.
He is a Fellow of OPTICA (2022), SPIE (2023), and the Institute of Physics (IOP, 2023), and has received numerous prestigious accolades, including the QEOD Fresnel Prize (EPS), ICO-IUPAP Young Scientist Prize, SPIE Advanced Photonics Young Innovator Award, and the Gold Medal with Congratulations of the Jury at the Geneva International Exhibition of Inventions. He has also been listed as a Clarivate and Elsevier Highly Cited Researcher for consecutive years.
CIM is dedicated to publishing high-impact original research and providing a leading platform for pioneering theoretical and experimental work in the field of computational imaging and metrology, driving both fundamental advancements and applied innovations across a broad spectrum of scientific, engineering, and industrial applications.
The journal is currently waiving all article processing charges (APCs) to encourage contributions from researchers worldwide. Welcome to submit high-quality manuscripts that advance the frontiers of computational imaging and metrology.
For more details, please visit the official website of Computational Imaging and Measurement: https://www.sciexplor.com/cim
CIM is now open for submissions. Submit your manuscript at: https://www.intellimanus.com/#/login?journalPath=cim